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| Email: |
jason@talkelab.ucsd.edu
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| Phone: |
858-534-7578
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| Fax: |
858-534-2720
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| Address: |
University of California, San Diego
Mail Code #0401
9500 Gilman Dr.
La Jolla, CA, 92093-0401
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Biography of Jason H Wang
Jason worked in the semiconductor industry for 10 years when he decided to
pursue his PhD. in mechanical engineering at The University of California,
San Diego. He worked as a mechanical engineer and designed test handling
machines to test electronic chips for Delta Design, ESI, and Aetrium/Symtek
in San Diego, California. He has been awarded three patents for various
designs of test handling equipment. He received a Masters of Science degree
in mechanical engineering from The New Jersey Institute of Technology and a
Bachelors of Science degree from Tankang University, Taipei, Taiwan.
While at CMRR, Jason's research concentrated on tape edge wear. The tape
edge wear results in an increase in tape's lateral motion, which limits the
maximum track density of digital tape. To understand this issue, he
developed a quantitative method to measure tape edge wear to nanometer
accuracy using Atomic Force Microscopy. His method was applied to research
the effect of the number of wear cycles, contact force, speed, and etc. on
tape edges wear. He used Scanning Electronic Microscopy to reveal the
mechanism of tape edge wear. A tester was developed and used to accelerate
tape edge wear. A wear equation was derived to simulate and predict tape
edge wear. His research provides a comprehensive investigation of tape edge
wear and will greatly improve track density of future tapes.
Last updated on September 20th, 2011